Semiconductor device manufacturing: process – Semiconductor substrate dicing – Having specified scribe region structure
Reexamination Certificate
2007-02-20
2007-02-20
Lebentritt, Michael (Department: 2812)
Semiconductor device manufacturing: process
Semiconductor substrate dicing
Having specified scribe region structure
C438S033000, C438S068000, C438S113000, C257SE21599
Reexamination Certificate
active
10986371
ABSTRACT:
A laser beam processing method for processing a wafer by applying a laser beam to a predetermined area, comprising the steps of forming a resin film which absorbs a laser beam, on the surface to be processed of the wafer; applying a laser beam to the surface to be processed of the wafer through the resin film; and removing the resin film after the laser beam application step.
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patent: 2003-320466 (2003-11-01), None
patent: 2004-188475 (2004-07-01), None
Furuta Kenji
Genda Satoshi
Kitahara Nobuyasu
Oba Ryugo
Yoshikawa Toshiyuki
Disco Corporation
Lebentritt Michael
Lee Cheung
Smith , Gambrell & Russell, LLP
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