Wafer-level testing of optical and optoelectronic chips

Optical waveguides – With optical coupler – Input/output coupler

Reexamination Certificate

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C324S754120

Reexamination Certificate

active

10820631

ABSTRACT:
This application describes, among others, wafer designs, testing systems and techniques for wafer-level optical testing by coupling probe light from top of the wafer.

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