4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Roman Malendevich

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Littrow gratings as alignment structures for the wafer level...

Optical waveguides – Integrated optical circuit
Reexamination Certificate

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Optical alignment loops for the wafer-level testing of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Optical alignment loops for the wafer-level testing of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Optical alignment loops for the wafer-level testing of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Optical probes with spacing sensors for the wafer level...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2367187

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