Wafer level chip stack method

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Assembly of plural semiconductive substrates each possessing...

Reexamination Certificate

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Details

C438S113000, C438S118000, C438S458000, C438S460000, C257SE21705

Reexamination Certificate

active

10944002

ABSTRACT:
Provided is a method by which differently-sized chips may be stacked at the wafer level. The wafer level chip stack method utilizes first and second wafer assemblies that support first and second wafers on adhesive tapes. One or both of the supported wafers may be sawed or otherwise divided to obtain separate first and second chips that remain fixed to respective first ring frames. The first and second wafer assemblies may then be positioned and aligned so that a back surface of the second wafer faces an active surface of the first wafer. Each of the second chips may then be bonded to a corresponding first chip to form a chip stack using an adhesive layer. The chip stacks may then be detached from the wafer assemblies and attached to a substrate.

REFERENCES:
patent: 6972069 (2005-12-01), Hecht et al.
patent: 6989285 (2006-01-01), Ball
patent: 2003/0232488 (2003-12-01), Chua et al.
patent: 2004/0097054 (2004-05-01), Abe
patent: 2001-196523 (2001-07-01), None
patent: 2001-196528 (2001-07-01), None
patent: 2001-0094408 (2001-11-01), None
patent: 2002-0031610 (2002-05-01), None

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