Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2011-08-23
2011-08-23
Ha, Nathan W (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257SE23179
Reexamination Certificate
active
08003983
ABSTRACT:
A wafer for manufacturing image sensors is disclosed. The wafer includes an image sensor and a test key. The image sensor includes a plurality of micro-lenses; the test key includes a plurality of micro-lens samples for defects inspection. The arrangement of the micro-lens samples on the test key is substantially different from the arrangement of the micro-lenses on the image sensor. The arrangement of the micro-lens samples on the test key allows defects inspection to become less complicated.
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Ha Nathan W
Hsu Winston
Margo Scott
United Microelectronics Corp.
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