Wafer fabrication of die-bottom contacts for electronic devices

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Wire contact – lead – or bond

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257773, 257787, 257506, H01L 2348, H01L 2352, H01L 2940

Patent

active

059106875

ABSTRACT:
A packaging technique for electronic devices includes wafer fabrication of contacts on the bottom surface of the substrate underneath the active circuit. Inherently reliable contacts suitable for a variety of devices can be formed, via a simple fabrication process, with good wafer packing density. In one embodiment, a trench is formed in the top surface of a substrate parallel to the edge of its electronic circuit. A gold wire extends from a connection point within the circuit into the trench. The gold wire may run over an insulating layer that ends part way through the trench. After epoxy encapsulating the top of the substrate, it is back thinned to expose the bottom surface of the gold wire. Either the back thinning is selective so as to form a substrate standoff, or an epoxy standoff is applied to the bottom of the substrate. A solderable wire runs onto the standoff from the gold wire exposed on the protrusion, possibly over another insulation layer. If an insulative substrate is used, the insulation layers may be optional. Sawing separates the electronic devices and completes their fabrication, without a subsequent assembly step. In another embodiment, the trench in which the gold wires and the solderable wires connect is formed from the bottom of the substrate after it has been epoxy encapsulated. Optionally, the bottom surface of the substrate of the finished device drops down to be co-planar with the contact bottom surfaces, so as to conduct heat out of the device.

REFERENCES:
patent: 4870475 (1989-09-01), Endo et al.
patent: 4931410 (1990-06-01), Tokunaga et al.
patent: 5071792 (1991-12-01), Van Vonno et al.
patent: 5280194 (1994-01-01), Richards et al.
patent: 5306942 (1994-04-01), Fuji
patent: 5353498 (1994-10-01), Fillion et al.
patent: 5403729 (1995-04-01), Richards et al.
patent: 5407864 (1995-04-01), Kim
patent: 5434745 (1995-07-01), Shokrgozar et al.
patent: 5441898 (1995-08-01), Richards et al.
patent: 5444009 (1995-08-01), Richards et al.
patent: 5455187 (1995-10-01), Richards et al.
patent: 5521420 (1996-05-01), Richards et al.
patent: 5557149 (1996-09-01), Richards et al.
patent: 5559362 (1996-09-01), Narita
patent: 5565697 (1996-10-01), Asakawa et al.
patent: 5592022 (1997-01-01), Richards et al.
patent: 5595935 (1997-01-01), Chan et al.
patent: 5606198 (1997-02-01), Ono et al.
patent: 5639694 (1997-06-01), Diffenderfer et al.
patent: 5656547 (1997-08-01), Richards et al.
"Joint Industry Standard Implementation of Flip Chip and Chip Scale Technology," The Institute for Interconnecting and Packaging Electronic Circuits (Jan. 1996).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Wafer fabrication of die-bottom contacts for electronic devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Wafer fabrication of die-bottom contacts for electronic devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wafer fabrication of die-bottom contacts for electronic devices will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1684949

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.