Abrading – Precision device or process - or with condition responsive... – Computer controlled
Reexamination Certificate
2005-01-11
2005-01-11
Eley, Timothy V. (Department: 3724)
Abrading
Precision device or process - or with condition responsive...
Computer controlled
C451S008000, C451S067000
Reexamination Certificate
active
06840841
ABSTRACT:
Disclosed is a wafer edge polishing system which improves the throughput and reduces the average processing cost. The system incorporates a wafer inspection unit. A wafer is polished in a wafer edge polishing unit and carried by a carrier unit to the wafer inspection unit where the polished surfaces of the wafer is inspected, and if it is judged as poorly polished, it is re-carried to the wafer edge polishing unit by the carrier unit.
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Eley Timothy V.
Speedfam Co., Ltd.
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