Wafer cleaning apparatus

Semiconductor device manufacturing: process – Chemical etching – Liquid phase etching

Reexamination Certificate

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Details

C438S750000, C134S001100, C134S001200

Reexamination Certificate

active

07037853

ABSTRACT:
An object of the present invention is to provide a wafer cleaning apparatus for cleaning wafers that have received various processing such as copper plating and chemical mechanical polishing. An apparatus for cleaning front and back surfaces of a wafer with solution while rotating the wafer that has been subjected to a fabrication process is disclosed. The apparatus comprises cleaning nozzles for spraying a cleaning solution, respectively, onto a front surface of the wafer that has been processed and onto a back surface thereof and also comprises an etching nozzle for spraying an etching solution onto a vicinity of the outer periphery of the wafer.

REFERENCES:
patent: 3953265 (1976-04-01), Hood
patent: 4439243 (1984-03-01), Titus
patent: 4489740 (1984-12-01), Rattan et al.
patent: 4510176 (1985-04-01), Cuthbert et al.
patent: 4518678 (1985-05-01), Allen
patent: 4732785 (1988-03-01), Brewer
patent: 4838289 (1989-06-01), Kottman et al.
patent: 4968375 (1990-11-01), Sato et al.
patent: 5176783 (1993-01-01), Yoshikawa
patent: 5349978 (1994-09-01), Sago et al.
patent: 5499733 (1996-03-01), Litvak
patent: 5634980 (1997-06-01), Tomita et al.
patent: 5688411 (1997-11-01), Kutsuzawa et al.
patent: 5706843 (1998-01-01), Matsuo
patent: 5723387 (1998-03-01), Chen
patent: 5783097 (1998-07-01), Lo et al.
patent: 5897379 (1999-04-01), Ulrich et al.
patent: 6012966 (2000-01-01), Ban et al.
patent: 6027630 (2000-02-01), Cohen
patent: 6056869 (2000-05-01), Uzoh
patent: 6099393 (2000-08-01), Katagiri et al.
patent: 6106907 (2000-08-01), Yoshikawa et al.
patent: 6110345 (2000-08-01), Iacoponi
patent: 6140233 (2000-10-01), Kwag et al.
patent: 6165050 (2000-12-01), Ban et al.
patent: 6180020 (2001-01-01), Moriyama et al.
patent: 6254760 (2001-07-01), Shen et al.
patent: 6258220 (2001-07-01), Dordi et al.
patent: 6265323 (2001-07-01), Nakamura et al.
patent: 6265328 (2001-07-01), Henely et al.
patent: 6294059 (2001-09-01), Hongo et al.
patent: 6332835 (2001-12-01), Nishimura et al.
patent: 6333275 (2001-12-01), Mayer et al.
patent: 6380086 (2002-04-01), Robinson et al.
patent: 6387190 (2002-05-01), Aoki et al.
patent: 6413436 (2002-07-01), Aegerter et al.
patent: 41 09 955 (1992-10-01), None
patent: 1-253923 (1989-10-01), None
patent: 2-253620 (1990-10-01), None
patent: 2-272738 (1990-11-01), None
patent: 5-13322 (1993-01-01), None
patent: 6-124887 (1994-05-01), None
patent: 8-37143 (1996-06-01), None
“Method Of And Apparatus For Cleaning Substrate” U.S. Appl. No. 09/679,305, filed Oct. 6, 2000, Ichiro Katakabe et al.
“Method Of And Apparatus For Cleaning Substrate” U.S. Appl. No. 10/390,600, filed Mar. 19, 2003, Ichiro Katakabe et al.
Co-pending U.S. Appl. No. 09/893,624, filed Jun. 29, 2001, entitled “Copper-Plating Liquid, Plating Method and Plating Apparatus”.

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