Voltage tolerant structure for I/O cells

Electronic digital logic circuitry – Interface – Current driving

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C326S086000

Reexamination Certificate

active

11028934

ABSTRACT:
An input/output (I/O) buffer having an input mode and coupled between first and second supply voltages includes a PMOS pull-up transistor fabricated in an nwell, and a gate bias control transistor coupled to the gate of the PMOS pull-up transistor for coupling the gate of the PMOS pull-up transistor to an input/output node in response to an input signal having a voltage greater than approximately the first supply voltage. A well bias control circuit is coupled to the PMOS pull-up transistor and to a well drive transistor to couple the nwell terminal to the first supply voltage in response to the input signal having a voltage approximately equal to or less than the first supply voltage.

REFERENCES:
patent: 5723987 (1998-03-01), Ronen
patent: 5926056 (1999-07-01), Morris et al.
patent: 5933027 (1999-08-01), Morris et al.
patent: 6130556 (2000-10-01), Schmitt
patent: 6144221 (2000-11-01), Oshima
patent: 6150843 (2000-11-01), Shiffer et al.
patent: 6194923 (2001-02-01), Dicke
patent: 6252423 (2001-06-01), Oshima
patent: 6323684 (2001-11-01), Oshima
patent: 6388475 (2002-05-01), Clark et al.
patent: 6573765 (2003-06-01), Bales et al.
patent: 6714043 (2004-03-01), Sharpe-Geisler
patent: 07066710 (1995-03-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Voltage tolerant structure for I/O cells does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Voltage tolerant structure for I/O cells, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Voltage tolerant structure for I/O cells will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3818254

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.