Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-04-08
2008-04-08
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
Reexamination Certificate
active
07356782
ABSTRACT:
A multi-layered substrate has a voltage reference signal circuit layout therein. A major change in the design of the multi-layered substrate is the moving of a reference signal trace from a signal layer to a non-signaling layer. Once the reference signal trace is moved, the signal traces within the signal layer can have a larger layout area. Similarly, the reference signal trace within the non-signaling layer can have greater layout flexibility in addition to electromagnetic shielding from other signal traces. Moreover, the reference signal trace having a greater width may be used to reduce parasitic resistance within the reference signal circuit.
REFERENCES:
patent: 5990547 (1999-11-01), Sharma et al.
patent: 6111205 (2000-08-01), Leddige et al.
patent: 6326244 (2001-12-01), Brooks et al.
Bowers Brandon W.
Chiang Jack
Jianq Chyun IP Office
VIA Technologies Inc.
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