Voltage monitoring test mode and test adapter

Details Voltage monitoring test mode and test adapter Voltage monitoring test mode and test adapter

2007-12-11

2007-12-11

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S005110, C714S025000, C714S042000, C714S734000, C365S201000

Reexamination Certificate

active

11116875

ABSTRACT:
A testing system has a processor, a module and at least one manufactured semiconductor device. The processor is configured to send and receive testing signals. The module is electrically coupled to the processor. The at least one manufactured semiconductor device is mounted on the module, and the semiconductor device has a plurality of pins at least one of which is a non-functional pin. The system is configured to provide the processor access to the semiconductor device. An external device monitors voltage at the non-functional pin of the semiconductor device.

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