Electrical computers and digital processing systems: support – Computer power control
Reexamination Certificate
2004-04-06
2008-11-04
Connolly, Mark (Department: 2115)
Electrical computers and digital processing systems: support
Computer power control
C713S600000, C714S047300, C714S048000, C714S731000
Reexamination Certificate
active
07447919
ABSTRACT:
Techniques are disclosed for increasing reliability of an integrated circuit. In one embodiment, an integrated circuit includes core chip circuitry. The integrated circuit includes means for increasing a power supply voltage V provided to the core chip circuitry, such as by increasing the voltage V to a maximum value. The integrated circuit also includes means for identifying a clock frequency F for which F<Pmax/(CV2), where C is a switching capacitance and where Pmaxis a predetermined maximum power consumption of the core chip circuitry. The integrated circuit also includes means for providing a clock signal having frequency F to the circuit.
REFERENCES:
patent: 5086238 (1992-02-01), Watanabe et al.
patent: 5303190 (1994-04-01), Pelley, III
patent: 5438543 (1995-08-01), Yoon
patent: 5440520 (1995-08-01), Schutz et al.
patent: 5526313 (1996-06-01), Etoh et al.
patent: 5532962 (1996-07-01), Auclair et al.
patent: 5644546 (1997-07-01), Furumochi et al.
patent: 5734622 (1998-03-01), Furumochi et al.
patent: 6141240 (2000-10-01), Madan et al.
patent: 6425086 (2002-07-01), Clark et al.
patent: 6499048 (2002-12-01), Williams
patent: 6509788 (2003-01-01), Naffziger et al.
patent: 6640313 (2003-10-01), Quach
patent: 6954916 (2005-10-01), Bernstein et al.
patent: 6976181 (2005-12-01), Dai et al.
patent: 7017073 (2006-03-01), Nair
patent: 7092281 (2006-08-01), Aipperspach et al.
patent: 7269780 (2007-09-01), Arima et al.
patent: 7329929 (2008-02-01), Kim et al.
patent: 2001/0034824 (2001-10-01), Mukherjee
patent: 2001/0034854 (2001-10-01), Mukherjee
patent: 2002/0116650 (2002-08-01), Halepete et al.
patent: 2002/0130712 (2002-09-01), Naffziger et al.
patent: 2002/0133745 (2002-09-01), Okin
patent: 2002/0188874 (2002-12-01), Yu et al.
patent: 2002/0194425 (2002-12-01), Penchuk
patent: 2004/0054936 (2004-03-01), Dwyer, III et al.
patent: 2005/0108509 (2005-05-01), Safford
patent: 2005/0240793 (2005-10-01), Safford
Matakias et al., A Circuit Detection of Soft and Timing Errors in Digital CMOS Ics, Feb. 14, 2004, Journal of Electronic Testing:Theory and Applications, vol. 20, pp. 523-531.
Liepe Steven F.
Naffziger Samuel
Connolly Mark
Hewlett--Packard Development Company, L.P.
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