Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-06-14
2005-06-14
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB
Reexamination Certificate
active
06906545
ABSTRACT:
There is provided a voltage measurement device that is stable with respect to an undershot or overshot input voltage of a pad. The voltage measurement device includes a voltage line, a pad, a signal generating unit, a first switch, and a second switch. The first switch is connected between the pad and the second switch and the second switch is connected to the voltage line. The signal generating unit receives a control signal and generates an inverted control signal. The voltage line is connected to the pad through the first and second switches that are responsive to the control signal. The pad is also connected to an internal circuit block, so that the internal circuit block is driven according to a pad input. Specifically, the first and second switches can be implemented with an NMOS transistor and a PMOS transistor that are responsive to the control signal and the inverted control signal, respectively. Therefore, even if a logic level input to the pad is an undershot or overshot voltage level, a voltage level of the voltage line is not changed.
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Jung Young-Hee
Kang Sang-Seok
Marger & Johnson & McCollom, P.C.
Nguyen Jimmy
Nguyen Vinh
Samsung Electronics Co,. Ltd.
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