Voltage margin testing for proximity communication

Details Voltage margin testing for proximity communication Voltage margin testing for proximity communication

2011-07-12

2011-07-12

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Error count or rate

C714S030000, C714S025000, C714S712000, C714S715000, C714S724000, C714S733000, C714S734000, C714S745000, C714S047300, C714S700000, C327S051000, C327S199000, C327S201000, C324S500000, C438S107000, C029S834000, C385S014000, C375S256000, C700S114000

Reexamination Certificate

active

07979754

ABSTRACT:
A method of testing a proximity communication system for voltage margin by impressing a voltage upon the data link between the transmitter on one chip and the receiver on the other chip coupled to the transmitter through a capacitively coupling circuit formed by juxtaposed capacitor pads on the respective two chips. The impressed voltage is varied and the output of the receiver is monitored to determine an operational voltage margin. The floating inputs on the receiver may be continuously biased by connecting them to variable biasing supply voltages through high impedances. When the floating inputs are periodically refreshed to a refresh voltage during a quiescent data period, the refresh voltage is varied between successive refresh cycles. The variable test voltage may be applied to transmitter output when it is in a high-impedance state, and the output of the receiver is measured.

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