Voltage generator with first drive current in test mode and seco

Details Voltage generator with first drive current in test mode and seco Voltage generator with first drive current in test mode and seco

1999-07-27

2000-10-17

Nelms, David

Static information storage and retrieval

Read/write circuit

Testing

365149, 36518909, 365226, 337536, G11C 700

Patent

active

061341622

ABSTRACT:
A method for testing a memory device. The method writes test data to an array of cells of the memory device during a test mode. The method calls for driving a cell plate of the memory device during at least a portion of the test with a current level that is less than the current used during normal operation. This amplifies the affect of defective cells on the cell plate voltage thereby allowing identification of unacceptably weak cells with shorter, less strenuous tests.

REFERENCES:
patent: Re35645 (1997-10-01), Tobita
patent: 5337272 (1994-08-01), Suwa et al.
patent: 5640340 (1997-06-01), Fink
patent: 5822258 (1998-10-01), Casper

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