Volatile memory elements with soft error upset immunity

Static information storage and retrieval – Systems using particular element – Flip-flop

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S156000, C365S226000, C365S227000, C365S228000, C365S229000

Reexamination Certificate

active

08077500

ABSTRACT:
Memory elements are provided that exhibit immunity to soft error upset events when subjected to high-energy atomic particle strikes. The memory elements may each have ten transistors. To overcome difficulties in writing data into the memory elements, signal strengths for one or more of the signals provided to the array may be adjusted. There may be two positive power supply voltages that are used in powering each memory element. One of the power supply voltages may be temporarily lowered relative to the other power supply voltage to enhance write margin during data loading operations. Other signal strengths that may be adjusted in this way include other power supply signals, data signal levels, address and clear signal magnitudes, and ground signal strengths. Adjustable power supply circuitry and data read-write control circuitry may be used in making these signal strength adjustments.

REFERENCES:
patent: 4380055 (1983-04-01), Larson
patent: 6172900 (2001-01-01), Mejia
patent: 6175533 (2001-01-01), Lee et al.
patent: 6275080 (2001-08-01), Phan et al.
patent: 6756692 (2004-06-01), Hirano et al.
patent: 6876572 (2005-04-01), Turner
patent: 6972987 (2005-12-01), Wong et al.
patent: 6975041 (2005-12-01), Hirano et al.
patent: 7277351 (2007-10-01), Liu et al.
patent: 7339816 (2008-03-01), Dastidar
patent: 7352610 (2008-04-01), Pedersen et al.
patent: 7388772 (2008-06-01), Xu et al.
patent: 7411853 (2008-08-01), Liu et al.
patent: 7430148 (2008-09-01), Liu et al.
patent: 7570537 (2009-08-01), Bhatia
patent: 7596013 (2009-09-01), Yamaoka et al.
patent: 7768818 (2010-08-01), Chan et al.
patent: 7821050 (2010-10-01), Liu et al.
patent: 7872903 (2011-01-01), Pedersen
patent: 7911826 (2011-03-01), Liu et al.
patent: 7920410 (2011-04-01), Lee et al.
patent: 2002/0130348 (2002-09-01), Tran
patent: 2004/0027902 (2004-02-01), Ooishi et al.
patent: 2006/0023535 (2006-02-01), Chun et al.
patent: 2006/0092745 (2006-05-01), Do
patent: 2006/0262612 (2006-11-01), Lovett
patent: 2007/0041242 (2007-02-01), Okazaki et al.
patent: 2008/0087927 (2008-04-01), Shin et al.
Perisetty, Srinivas. U.S. Appl. No. 12/134,138, filed Jun. 5, 2008.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Volatile memory elements with soft error upset immunity does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Volatile memory elements with soft error upset immunity, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Volatile memory elements with soft error upset immunity will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4309964

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.