Volatile memory elements with soft error upset immunity

Details Volatile memory elements with soft error upset immunity Volatile memory elements with soft error upset immunity

2011-01-18

2011-01-18

Auduong, Gene N. (Department: 2827)

Static information storage and retrieval

Systems using particular element

Flip-flop

C365S063000, C365S230060

Reexamination Certificate

active

07872903

ABSTRACT:
Memory elements are provided that exhibit immunity to soft error upset events when subjected to high-energy atomic particle strikes. The memory elements may each have ten transistors including two address transistors and four transistor pairs that are interconnected to form a bistable element. Clear lines such as true and complement clear lines may be routed to positive power supply terminals and ground power supply terminals associated with certain transistor pairs. During clear operations, some or all of the transistor pairs can be selectively depowered using the clear lines. This facilitates clear operations in which logic zero values are driven through the address transistors and reduces cross-bar current surges.

REFERENCES:
patent: 4852060 (1989-07-01), Rockett, Jr.
patent: 5307142 (1994-04-01), Corbett et al.
patent: 5331164 (1994-07-01), Buehler et al.
patent: 5504703 (1996-04-01), Bansal
patent: 5631863 (1997-05-01), Fechner et al.
patent: 6275080 (2001-08-01), Phan et al.
patent: 6975041 (2005-12-01), Hirano et al.
patent: 7092309 (2006-08-01), Liaw
patent: 7193887 (2007-03-01), Wood
patent: 7233518 (2007-06-01), Liu
patent: 7352610 (2008-04-01), Pedersen et al.
patent: 7366006 (2008-04-01), Zhang
patent: 2002/0130348 (2002-09-01), Tran
patent: 2005/0259462 (2005-11-01), Wood
patent: 2006/0262612 (2006-11-01), Lovett
patent: 2007/0041242 (2007-02-01), Okazaki et al.
patent: 2008/0087927 (2008-04-01), Shin et al.
Calin et al., “Upset Hardened Memory Design for Submicron CMOS Technology”, IEEE Transactions on Nuclear Science, vol. 43, No. 6, Dec. 1996.
Rahim et al. U.S. Appl. No. 61/113,573, filed Nov. 11, 2008.
Xu et al. U.S. Appl. No. 61/113,576, filed Nov. 11, 2008.
Rahim et al. U.S. Appl. No. 61/120,334, filed Dec. 5, 2008.
Lee et al. U.S. Appl. No. 12/391,230, filed Feb. 23, 2009.
Xu et al. U.S. Appl. No. 61/101,998, filed Oct. 1, 2008.
Rahim et al. U.S. Appl. No. 61/102,000, filed Oct. 1, 2008.
Rahim et al. U.S. Appl. No. 61/102,003, filed Oct. 1, 2008.

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