Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device
Reexamination Certificate
2000-09-15
2004-01-20
Baxter, Janet (Department: 1752)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making electrical device
C430S022000, C430S322000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
06680162
ABSTRACT:
BACKGROUND OF THE INVENTION
This invention relates in general to VLSI fabrication techniques and, more specifically, to using these techniques to store information.
Any unnecessary traces of a metal, an oxide or a polysemiconductor are avoided in semiconductor processing. Adding unnecessary traces makes the mask and fabrication more complex. This added complexity can increase the likelihood of defects in the finished semiconductor circuit. Consequently, semiconductor circuits avoid use of unnecessary traces.
Progress in VLSI technology over the past few decades has been phenomenal. Packing densities have increased by several orders of magnitude. However, to date, VLSI technology has been used largely for creating electronic circuits, micro-machines or sensors. Other uses for the VLSI technology are needed.
SUMMARY OF THE INVENTION
The invention relates to using VLSI techniques to store information on a substrate. One embodiment of a die with text deposited upon the die uses semiconductor processing techniques during fabrication. Included in the die are a substrate, a first paragraph and a second paragraph. The first and second paragraphs are in contact with the substrate. The second paragraph is aligned with the first paragraph in a column.
REFERENCES:
patent: 3626824 (1971-12-01), Kolb
Nadim Maluf,An Introduction to Microelectromechanical Systems Enginneering,Microelectromechanical Systems Series, 2000 Artech House, Inc., Norwood, MA, 4 pages, Preface p.xx.
Kluender Keith R.
Lipson Pamela R.
Sinha Pawan
Baxter Janet
Inscript, LLC
Lee Sin J.
Townsend and Townsend / and Crew LLP
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