Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-04-11
2008-10-14
Kik, Phallaka (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C703S002000, C703S006000, C703S016000
Reexamination Certificate
active
07437691
ABSTRACT:
A system and method are disclosed for legalizing a flat or hierarchical VLSI layout to meet multiple grid constraints and conventional ground rules. Given a set of ground rules with multiple grid constraints and a VLSI layout (either hierarchical or flat) which is layout-versus-schematic (LVS) correct but may not be ground rule correct, the system and method provide a legalized layout which meets the multiple grid constraints while maintaining LVS correctness and fixing the ground rule errors as much as possible with minimum layout perturbation from the input design. The system and method support multiple grid pitch constraints for hierarchical design, and provide for LVS correctness to be maintained while an on-grid solution possibly with some spacing violations.
REFERENCES:
patent: 5281558 (1994-01-01), Bamji et al.
patent: 5381343 (1995-01-01), Bamji et al.
patent: 5469367 (1995-11-01), Puri et al.
patent: 5493509 (1996-02-01), Matsumoto et al.
patent: 5636132 (1997-06-01), Kamdar
patent: 5856927 (1999-01-01), Greidinger et al.
patent: 6122443 (2000-09-01), Nishikawa
patent: 6189132 (2001-02-01), Heng et al.
patent: 6317864 (2001-11-01), Kikuchi et al.
patent: 6477693 (2002-11-01), Marchenko et al.
patent: 6587992 (2003-07-01), Marple
patent: 6910196 (2005-06-01), Cocchini
patent: 6948143 (2005-09-01), Donelly et al.
patent: 6986109 (2006-01-01), Allen et al.
patent: 7047504 (2006-05-01), Kawano
patent: 7137097 (2006-11-01), Aji et al.
patent: 7155697 (2006-12-01), Teig et al.
patent: 7187992 (2007-03-01), Tuszynski
patent: 7225421 (2007-05-01), Migatz et al.
patent: 7239991 (2007-07-01), Tuszynski
patent: 7302651 (2007-11-01), Allen et al.
patent: 2003/0009728 (2003-01-01), Marple
patent: 2003/0177454 (2003-09-01), Kawano
patent: 2004/0044979 (2004-03-01), Aji et al.
patent: 2004/0225981 (2004-11-01), Cocchini
patent: 2004/0225982 (2004-11-01), Donelly et al.
patent: 2004/0230922 (2004-11-01), Allen et al.
patent: 2005/0125748 (2005-06-01), Gray et al.
patent: 2005/0132306 (2005-06-01), Smith et al.
patent: 2006/0101356 (2006-05-01), Allen et al.
patent: 2006/0190899 (2006-08-01), Migatz et al.
patent: 2007/0150846 (2007-06-01), Furnish et al.
patent: 2007/0204252 (2007-08-01), Furnish et al.
patent: 2007/0245283 (2007-10-01), Allen et al.
patent: 2007/0277129 (2007-11-01), Allen et al.
Poo et al., “Time-Varying Maximum Transition Run Constraints”, International Symposium on Information Theory, Sep. 4-9, 2005, pp. 1468-1472.
Xin Yuan et al., “Technology Migration Technique for Designs with Strong RET-driven Layout Restrictions”, ISPD '05, Apr. 3-6, 2005, San Francisco, California, USA, 8 pages.
Tang Xiaoping
Yuan Xin
Greenblum & Bernstein P.L.C.
International Business Machines - Corporation
Kik Phallaka
Kotulak Richard
LandOfFree
VLSI artwork legalization for hierarchical designs with... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with VLSI artwork legalization for hierarchical designs with..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and VLSI artwork legalization for hierarchical designs with... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3990338