Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-10-30
2007-10-30
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
10907496
ABSTRACT:
Methods, systems and program products are disclosed that prioritize each target via for via redundancy based on at least one of the following: subnet timing information, a distance of a target via along a path from a driving source and a target via net/subnet characteristic, and attempt to add a redundant via to each target via based on the prioritization. The invention improves overall yield and reduces timing sensitivity to AC-related defects.
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Correale, Jr. Anthony
Dewey, III Lewis W.
Hibbeler Jason D.
Chiang Jack
Dimyan Magid Y.
Hoffman Warnick & D'Alessandro LLC
International Business Machines - Corporation
Kotulak Richard M.
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