Via hole forming method

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE21578, C438S672000, C438S673000, C438S674000, C438S675000, C438S676000

Reexamination Certificate

active

07618892

ABSTRACT:
A method of forming a via hole reaching a bonding pad in a wafer having an insulating film constituting a plurality of devices on the front surface of a substrate and bonding pads on each of the devices by applying a pulse laser beam to the rear surface of the substrate, the method comprising the steps of:forming a non-through hole reaching the insulating film formed on the substrate by applying a pulse laser beam to the rear surface of the substrate;forming an insulating film on the inner wall of the hole which is formed in the substrate by the first step; andforming a via hole reaching a bonding pad by applying a pulse laser beam to the hole having the insulating film which is formed on the inner wall by the insulating film forming step.

REFERENCES:
patent: 4964212 (1990-10-01), Deroux-Dauphin et al.
patent: 7057274 (2006-06-01), Heschel
patent: 7449784 (2008-11-01), Sherrer et al.
patent: 2004/0198040 (2004-10-01), Geefay et al.
patent: 2007/0026639 (2007-02-01), Noma et al.
patent: 2007/0045254 (2007-03-01), Morikazu
patent: 2007/0257373 (2007-11-01), Akram et al.
patent: 2003-163323 (2003-06-01), None
patent: 2007-67082 (2007-03-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Via hole forming method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Via hole forming method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Via hole forming method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4093222

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.