Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-04-19
2005-04-19
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
06883149
ABSTRACT:
In a multi-wide class design layout, design rule checks for enclosure of multi wide class objects prevent false errors or false passes by performing such checks against the non-virtual boundaries of a wide class object, and not against the virtual boundaries. An exemplary embodiment provides a method for identifying as a violation, for each wide class wiobject, any geometry on another layer which is located at least partially inside the wiobject and has any portion thereof located within a distance encliof any non-virtual boundary of the wiobject. The exemplary method is preferably performed using effective wide class objects.
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Li Mu-Jing
Yang Amy
Do Thuan
Sun Microsystems Inc.
Zagorin O'Brien Graham LLP
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