Static information storage and retrieval – Systems using particular element – Ferroelectric
Reexamination Certificate
2010-02-03
2011-11-22
Phung, Anh (Department: 2824)
Static information storage and retrieval
Systems using particular element
Ferroelectric
C365S189150
Reexamination Certificate
active
08064242
ABSTRACT:
For replacing SRAM with very high speed FRAM, new memory architecture is realized such that plurality of FRAM cells is connected to a local bit line pair, a local sense amp is connected to the local bit line pair, a global sense amp is connected to the local sense amp through a global bit line pair, and a locking signal generator is connected to the global sense amp for generating a locking signal which disables the local sense amp after reading for quick write-back operation. With short bit line architecture, bit lines are multi-divided for reducing parasitic capacitance of the local bit line, which realizes to reduce the ferroelectric capacitor proportionally. The FRAM cell includes an access transistor pair, a ferroelectric capacitor pair for storing positive data and negative data, and a reset transistor pair for resetting storage nodes. And various circuits for implementing the memory are described.
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Kim Juhan
King Douglas
Phung Anh
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