Vertically oriented DRAM structure

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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757296, 757328, 757347, 757350, 757352, H01L 2910, H01L 2972

Patent

active

055788505

ABSTRACT:
A vertical transistor (10) has a substrate (12) and a control electrode conductive layer (18), which functions as a control or gate electrode. A sidewall dielectric layer (22) is formed laterally adjacent the control electrode conductive layer (18) and overlying the substrate (12). The conductive layer (18) at least partially surrounds a channel region (30). A vertical conductive region is formed within a device opening wherein a bottom portion of the conductive region is a first current electrode (28). A middle portion of the vertical conductive region is the channel region (30). A top portion of the vertical conductive region is a second current electrode (34).

REFERENCES:
patent: 4530149 (1985-07-01), Jastrzebski et al.
patent: 4764801 (1988-08-01), McLaughlin et al.
patent: 4860077 (1989-08-01), Reuss et al.
patent: 4902641 (1990-02-01), Koury, Jr.
patent: 4974060 (1990-11-01), Ogasawara
patent: 4984030 (1991-01-01), Sunami et al.
patent: 5057888 (1991-10-01), Fazan et al.
patent: 5061650 (1991-10-01), Dennison et al.
patent: 5066607 (1991-11-01), Banerjee
patent: 5072269 (1991-12-01), Hieda
patent: 5091761 (1992-02-01), Hiraiwa et al.
patent: 5100823 (1992-03-01), Yamada
patent: 5100825 (1992-03-01), Fazan et al.
patent: 5106775 (1992-04-01), Kaga et al.
patent: 5106776 (1992-04-01), Shen et al.
patent: 5122476 (1992-06-01), Fazan et al.
patent: 5128273 (1992-07-01), Ema
patent: 5281837 (1994-01-01), Kohyama
"Impact of Surrounding Gate Transistor (SGT) for Ultra-High Density LSI's", Takato et al; IEEE Trans. on Electron Devices, vol. 38, No. 3, Mar. 1991, pp. 573-577.
A Trench Transistor Cross-Point DRAM Cell; Richardson et al; IEEE IEDM Conference 1985, pp. 714-717 No Month.

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