Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-05-29
2007-05-29
Pham, Hoai (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S329000, C257S335000, C257S341000, C257S342000
Reexamination Certificate
active
10804018
ABSTRACT:
As and B are implanted to side surfaces of trenches3by a rotation ion implanting method, and by using a difference between these impurities in diffusion coefficient, the structure in which an n−-type epitaxial Si layer is interposed between trenches3is converted into a semiconductor structure consisting of n-type pillar layer5/p-type pillar layer4
-type pillar layer5lining up. The structure can function substantially the same role as that of a super junction structure.
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Izumisawa Masaru
Kawano Takahiro
Kouzuki Shigeo
Saito Yoshihiko
Tokano Keinichi
Kabushiki Kaisha Toshiba
Kalam Abul
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Pham Hoai
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