Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate
2006-07-18
2006-07-18
Cao, Phat X. (Department: 2814)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
C438S173000
Reexamination Certificate
active
07078280
ABSTRACT:
An architecture for creating a vertical silicon-on-insulator MOSFET. Generally, an integrated circuit structure includes a semiconductor area with a major surface formed along a plane and a first source/drain contact region formed in the surface. A relatively thin single crystalline layer is oriented vertically above the major surface and comprises a first source/drain doped region over which is located a doped channel region, over which is located a second source/drain region. An insulating layer is disposed adjacent said first and said second source/drain regions and said channel region, serving as the insulating material of the SOI device. In another embodiment, insulating material is adjacent only said first and said second source/drain regions. A conductive region is adjacent the channel region for connecting the back side of the channel region to ground, for example, to prevent the channel region from floating.In an associated method of manufacturing the semiconductor device, a first source/drain region is formed in a relatively thin vertical layer of single crystalline material. A MOSFET gate region, including a channel and a gate electrode, is formed over the first source/drain region. A second source/drain region is then formed over the channel, the regions being appropriately doped to effect MOSFET action.
REFERENCES:
patent: 4366495 (1982-12-01), Goodman et al.
patent: 4455565 (1984-06-01), Goodman et al.
patent: 4587713 (1986-05-01), Goodman et al.
patent: 4683643 (1987-08-01), Nakajima et al.
patent: 4786953 (1988-11-01), Morie et al.
patent: 4837606 (1989-06-01), Goodman et al.
patent: 5342797 (1994-08-01), Sapp et al.
patent: 5414289 (1995-05-01), Fitch et al.
patent: 5576238 (1996-11-01), Fu
patent: 5668391 (1997-09-01), Kim et al.
patent: 5744846 (1998-04-01), Batra et al.
patent: 6027975 (2000-02-01), Hergenrother et al.
patent: 6072216 (2000-06-01), Williams et al.
patent: 6121077 (2000-09-01), Hu et al.
patent: 6133099 (2000-10-01), Sawada
patent: 6197641 (2001-03-01), Hergenrother et al.
patent: 6297531 (2001-10-01), Armacost et al.
patent: 6506638 (2003-01-01), Yu
patent: 2004/0110345 (2004-06-01), Chaudhry et al.
Dudek, et al, “Lithography-Independent Nanometer Silicon MOSFET's on Insulator”, IEEE Transactions on Electron Devices, vol. 43, No. 10, Oct. 1996, pp. 1626-1631.
Risch, et al, “Vertical MOS Transistors with 70 nm Channel Length”, IEEE Transactions on Electron Devices, vol. 43, No. 9, Sep. 1996, pp. 1495-1498.
Takato, et al, “Impact of Surrounding Gate Transistor (SGT) for Ultra-High-Density LSI's”, IEEE Transactions on Electron Devices, vol. 38, No. 3, Mar. 1991, pp. 573-577.
Takato, et al, “High Performance CMOS Surrounding Gate Transistor (SGT) for Ultra High Density LSIs”, IEDM 1988, pp. 222-225.
Hergenrother, et al, “The Vertical Replacement-Gate (VRG) MOSFET: A 50-nm Vertical MOSFET withLithography-Independent Gate Length”, Technical Digest of IEDM, 1999, pp. 75-78.
Oh, et al, “50 nm Vertical Replacement-Gate (VRG) pMOSFETs”, IEEE 2000.
Hergenrother, et al, “The Vertical Replacement-Gate (VRG) MOSFETt: A High Performance Vertical MOSFET with Lithography-Independent Critical Dimensions”, no publication information apparent from document.
Monroe, et al, “The Vertical Replacement-Gate (VRG) Process for Scalable, General-purpose Complementary Logic”, Paper 7.5, pp. 1-7, date and publication information unknown.
Chaudhry Samir
Layman Paul Arthur
McMacken John Russell
Thomson J. Ross
Zhao Jack Qingsheng
Agere Systems Inc.
Cao Phat X.
LandOfFree
Vertical replacement-gate silicon-on-insulator transistor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Vertical replacement-gate silicon-on-insulator transistor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Vertical replacement-gate silicon-on-insulator transistor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3587994