Vertical interconnection structure and methods

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S596000, C438S608000, C438S257000, C438S268000

Reexamination Certificate

active

06893951

ABSTRACT:
Interconnection structures for integrated circuits have first cells disposed in a first plane, at least second cells disposed in at least a second plane parallel to the first plane, and vertical interconnections disposed for connecting conductors in the first plane with conductors in the second plane, at least some of the vertical interconnections initially incorporating antifuses. The antifuses may be disposed over conductors that are disposed on a base substrate. The antifuses are selectively fused to prepare the integrated circuit for normal operation. Methods for fabricating and using such vertical interconnection structures are disclosed.

REFERENCES:
patent: 3271591 (1966-09-01), Ovshinsky
patent: 3530441 (1970-09-01), Ovshinsky
patent: 3641516 (1972-02-01), Castrucci et al.
patent: 4499557 (1985-02-01), Holmberg et al.
patent: 4599705 (1986-07-01), Holmberg et al.
patent: 4666252 (1987-05-01), Yaniv et al.
patent: 5335219 (1994-08-01), Ovshinsky et al.
patent: 5573971 (1996-11-01), Cleeves
patent: 5581501 (1996-12-01), Sansbury et al.
patent: 5625220 (1997-04-01), Liu et al.
patent: 5693556 (1997-12-01), Cleeves
patent: 5751012 (1998-05-01), Wolstenholme et al.
patent: 5821558 (1998-10-01), Han et al.
patent: 5847441 (1998-12-01), Cutter et al.
patent: 6034882 (2000-03-01), Johnson et al.
patent: 6051851 (2000-04-01), Ohmi et al.
patent: 6111302 (2000-08-01), Zhang et al.
patent: 6118138 (2000-09-01), Farnworth et al.
patent: 6153468 (2000-11-01), Forbes et al.
patent: 6185122 (2001-02-01), Johnson et al.
patent: 6251710 (2001-06-01), Radens et al.
patent: 6288437 (2001-09-01), Forbes et al.
patent: 6297989 (2001-10-01), Cloud et al.
patent: 6351406 (2002-02-01), Johnson et al.
patent: 6372633 (2002-04-01), Maydan et al.
patent: 6380003 (2002-04-01), Jahnes et al.
patent: 6483736 (2002-11-01), Johnson et al.
patent: 6521958 (2003-02-01), Forbes et al.
patent: 6661691 (2003-12-01), Fricke et al.
patent: 6781858 (2004-08-01), Fricke et al.
patent: 20010011776 (2001-08-01), Igarashi et al.
patent: 20010036750 (2001-11-01), Radens et al.
patent: 20010055838 (2001-12-01), Walker et al.
patent: 20020058408 (2002-05-01), Maydan et al.
patent: 20020075719 (2002-06-01), Johnson et al.
patent: 20020083390 (2002-06-01), Lee et al.
Chan et al, “Multiple Layers of CMOS Integrated Circuits Using Recrystallized Silicon Film”, IEEE Electron Device Letters, V.22 (2), Feb. 2001, pp 77-79.
Thomas H Lee, “A Vertical Leap for Microchips”, Scientific American, Jan. 2002, pp 53-59.
Hamdy et al, “Dielectric based antifuses for logic and memory ICs”, IEEE Int'l Electron Devices Meeting, IEDM 88, Aug. 1988, pp 786-789.
Chenming Hu, “Interconnect devices for field programmable gate array”, IEEE Int'l Electron Devices Meeting, IEDM 92, Apr. 1992, pp 591-594.
Jonathan Green et al, “Antifuse Field Programmable Gate Arrays”, Proc. IEEE, vol. 81(7), Jul. 1993, pp 1042-1056.
Kulkarni et al, “Patterning of Submicron Metal Features and Pillars in Multilevel Metallization”, J. Electrochem Soc., V. 135 (12), Dec. 1988, pp 3094-3098.

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