Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Non-single crystal – or recrystallized – material with...
Reexamination Certificate
2009-11-12
2011-11-08
Mandala, Victor A (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Non-single crystal, or recrystallized, semiconductor...
Non-single crystal, or recrystallized, material with...
C257S065000, C257SE29237, C257SE29003, C257SE29004, C257SE29327, C257SE21090, C438S488000
Reexamination Certificate
active
08053776
ABSTRACT:
In a vertical diode, an N+-type layer, an N−-type layer, and a P+-type layer are stacked in this order on a lower electrode film, and an upper electrode film is provided thereon. The effective impurity concentration of the N−-type layer is lower than the effective impurity concentrations of the N+-type layer and the P+-type layer. At least one of the N+-type layer, the N−-type layer, and the P+-type layer is formed from a small grain size polycrystalline semiconductor whose each crystal grain does not penetrate each layer through its thickness.
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Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Kabushiki Kaisha Toshiba
Mandala Victor A
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