Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-05-17
2005-05-17
Loke, Steven (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S301000, C257S328000, C257S329000, C257S330000
Reexamination Certificate
active
06894336
ABSTRACT:
An access transistor (140) for a vertical DRAM device (110) and method of forming thereof. Trenches (114) are formed in a semiconductor wafer substrate (112), and storage capacitors (118) are formed in the bottom portion of the trenches (114). The trenches (114) are curved in a channel (130) region formed in a top portion of the trenches (114). The channel (130) is curved about a central point c, and the channel extends into the substrate (112) by a distance d along a radius b. A gate oxide (126) is disposed adjacent the curved channel (130), and a gate conductor (128) is disposed adjacent the gate oxide (126).
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Infineon - Technologies AG
Loke Steven
Slater & Matsil L.L.P.
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