Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-04-11
2006-04-11
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010, C324S763010
Reexamination Certificate
active
07026838
ABSTRACT:
The present invention provides a system (200) for performing accelerated stress characterization of a given transistor (204). Inverter circuits, formed from the given transistor, are disposed in series with one another (202). A plurality of signal taps is operatively associated with each gap between adjacent inverter circuits. Selective circuitry is operatively coupled to the plurality of signal taps, and adapted to output (206) data from a first and a second of the plurality of signal taps. A controlled voltage component (212) is operatively coupled the plurality of inverter circuits, and adapted to supply a desired supply voltage. A controlled signal component (210) is operatively coupled the plurality of inverter circuits, and adapted to supply a signal of a desired frequency thereto. An evaluation component (208) receives signal data from the first and second signal taps for evaluation or processing.
REFERENCES:
patent: 6333879 (2001-12-01), Kato et al.
patent: 6628134 (2003-09-01), Lee
patent: 6759863 (2004-07-01), Moore
Raha Prasun
Reddy Vijay Kumar
Brady III W. James
Stewart Alan K.
Tang Minh N.
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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