Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-10-30
2010-06-01
Lin, Sun J (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07730436
ABSTRACT:
A simultaneous satisfiability algorithm, or SSAT, allows simultaneous checks to be made efficiently for a number of literals, x1, . . . ,xnwhether x1is true under any satisfying assignments of a formula (written in conjunctive normal form) built from the variables of these literals and other variables (or, equivalently whether x1is a logical consequence of the formula). Thus, several related satisfiability checks are performed simultaneously in SSAT. Temporal induction algorithms allow the verification of the sequential behavior of finite state machines, e.g., hardware. Temporal induction algorithms may employ a SSAT solver to perform simultaneous model checking of several invariant (or safety) properties efficiently. These SSAT-based temporal induction algorithms are double-incremental, such that all learned clauses in the SSAT solver are re-used both across verified properties as well as across time frames.
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Hanna Ziyad
Khasidashvili Zurab
Nadel Alexander
Palti Amit
Boone Carrie
Carrie A. Boone, P.C.
Intel Corporation
Lin Sun J
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