Verification supporting system

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Logic design processing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C716S104000, C716S107000, C716S111000, C716S132000, C716S136000, C703S013000, C703S014000

Reexamination Certificate

active

07984403

ABSTRACT:
A verification target register to be verified is specified from a configuration of a verification target circuit, and patterns requiring verification are extracted as a coverage standard with regard to the specified verification target register. When the patterns are extracted, a DIRW matrix is prepared to indicate possibly occurring state transitions among four states Declare, Initialize, Read, and Write in the register included in the verification target circuit, and used to decide two coverage standards, a matrix coverage standard and an implementation coverage standard.

REFERENCES:
patent: 5511003 (1996-04-01), Agarwal
patent: 7013376 (2006-03-01), Hooper
patent: 7017043 (2006-03-01), Potkonjak
patent: 7266791 (2007-09-01), Morishita et al.
patent: 7392492 (2008-06-01), Hong et al.
patent: 7565631 (2009-07-01), Banerjee et al.
patent: 7761281 (2010-07-01), Bankes
patent: 7822591 (2010-10-01), Otsuki et al.
patent: 2006/0155521 (2006-07-01), Iwashita
patent: 2006/0190861 (2006-08-01), Matsuura
patent: 2006/0200720 (2006-09-01), Grimme et al.
patent: 2008/0098336 (2008-04-01), Tanimoto et al.
patent: 2008/0263487 (2008-10-01), Hong et al.
patent: 2009/0144595 (2009-06-01), Reohr et al.
patent: 2009/0276740 (2009-11-01), Matsuda et al.
patent: 2009/0319245 (2009-12-01), Ivchenko et al.
patent: A 2006-190209 (2006-07-01), None
patent: A 2006-201980 (2006-08-01), None
Boubezari et al.; “Testability analysis and test-point insertion in RTL VHDL specifications for scan-based BIST”; Publication Year: 1999; Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on; vol. 18 , Issue: 9; pp. 1327-1340.
Harry D. Foster, et al., “Programming Code metrics,” Assertion-Based Design, 2ndEdition, pp. 129-130, 2004.
Yusuke Matsunaga, “Basic techniques for high-level synthesis,” Proceedings of the Society Conference of IEICE, Sep. 2003.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Verification supporting system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Verification supporting system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Verification supporting system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2730075

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.