Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Logic design processing
Reexamination Certificate
2011-07-19
2011-07-19
Rossoshek, Helen (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Logic design processing
C716S104000, C716S107000, C716S111000, C716S132000, C716S136000, C703S013000, C703S014000
Reexamination Certificate
active
07984403
ABSTRACT:
A verification target register to be verified is specified from a configuration of a verification target circuit, and patterns requiring verification are extracted as a coverage standard with regard to the specified verification target register. When the patterns are extracted, a DIRW matrix is prepared to indicate possibly occurring state transitions among four states Declare, Initialize, Read, and Write in the register included in the verification target circuit, and used to decide two coverage standards, a matrix coverage standard and an implementation coverage standard.
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Matsuda Akio
Nakata Tsuneo
Oishi Ryosuke
Takayama Koichiro
Fujitsu Limited
Greer Burns & Crain Ltd.
Rossoshek Helen
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