Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-08-16
2008-12-09
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07464363
ABSTRACT:
A verification support device supports logic verification of a design object corresponding to modified sequence diagrams obtained by modifying sequence diagrams expressing processes of a design object in a chronological order. A diagram extracting unit extracts the modified sequence diagrams. A modified process detecting unit detects modified processes by comparing the sequence diagrams before modification and the sequence diagrams after modification. Based on the modified processes, an applicability determining unit determines whether test benches used for a regression test of the design object of the sequence diagrams before modification is applicable to a regression test of the design object of the sequence diagrams after modification. A test bench output unit outputs test benches based on a result of determination by the applicability determining unit.
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Office Action issued in corresponding Japanese Patent Application No. 2006-510564, mailed on Jan. 15, 2008.
Abe Kenji
Sasaki Takayuki
Chiang Jack
Fujitsu Limited
Staas & Halsey , LLP
Tat Binh C
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