Verification of digital circuitry using range generators

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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Details

C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

07117463

ABSTRACT:
An embodiment of the present invention includes a range generator to simplify equivalence checking. A range generator is constructed. The range generator is represented by a characteristic function of a range of a cut function for a cut circuit in an implementation circuit and a reference circuit. The range generator is simpler than the cut circuit. Equivalence of the implementation circuit and the reference circuit is checked using the range generator.

REFERENCES:
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Evgueni I. Goldberg, et. al., Using SAT for Combinational Equivalence Checking, University of Berkeley.
Henrik Hulgaard, et. al., Equivalence Checking of Combinational Circuits using Boolean Expression Diagrams, IEEE Transactions on CAD, Jul. 1999.
Chung-Yang (RIC) Huang, et. al., Static Property Checking Using ATPG v.s. BDD Techniques, University of California Santa Barbara, CA.
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Navin Vemuri, et. al., BDD-based Logic Synthesis for LUT-based FPGAs, ACM, 2002, Association for Computing Machinery.
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Kurt Keutzer, Professor, Implementation Verification: Static Timing Verification, University of California Berkeley, CA.
Jim Smith, et. al., Polynomial Methods for Allocating Complex Components, Computer Systems Laboratory, Stanford University.
Wolfgang Kunz, Verification Problems and Solutions, Dept. of Computer Science, University of Frankfurt/Main, Germany.
Shi-Yu Huang, Formal Equivalence Checking And Design Debugging, 1998, Chapters 3-4, Kluwer Academic Publishers, Norwell, Massachusetts, USA.

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