Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-10-03
2006-10-03
Lin, Sun James (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07117463
ABSTRACT:
An embodiment of the present invention includes a range generator to simplify equivalence checking. A range generator is constructed. The range generator is represented by a characteristic function of a range of a cut function for a cut circuit in an implementation circuit and a reference circuit. The range generator is simpler than the cut circuit. Equivalence of the implementation circuit and the reference circuit is checked using the range generator.
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Graham Robert M.
McElvain Kenneth S.
Blakely Sokolff Taylor & Zafman LLP
Lin Sun James
Synplicity, Inc.
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