Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-03-15
2009-08-18
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07577928
ABSTRACT:
A system, apparatus and method for generating and validating extracted timing model files, such as macro library files, are disclosed. A user interface or data template is provided to an engineer that allows for the population of data within particular fields related to timing characteristics of an IP block, cell or core. An extracted timing model file is generated and a validation procedure is performed. This validation procedure may include comparing the information with the file to a test bench have a plurality of test points. In particular, data provided by the engineer is checked against multiple criteria to ensure that this data is valid and/or falls within an appropriate value range constraints. After the validation procedure has completed, the engineer is provided a summary of the validation results.
REFERENCES:
patent: 2005/0198601 (2005-09-01), Kuang et al.
Bhutani Sandeep
Kirchner Richard K.
Lindberg Peter
Do Thuan
LSI Logic Corporation
Ryan & Mason & Lewis, LLP
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