Vector impedance measurement system and method of using same

Details Vector impedance measurement system and method of using same Vector impedance measurement system and method of using same

2007-07-30

2009-12-08

He, Amy (Department: 2831)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C324S537000, C324S650000

Reexamination Certificate

active

07629795

ABSTRACT:
A vector impedance measurement system (100) includes a first radio frequency (RF) source (101) for providing energy to a test circuit. A measurement device (111) is used for providing a first network measurement based upon the voltage and current at the terminals of the test circuit. A second RF source (103) is used for down converting the first network measurement to a second network measurement that is lower in frequency. The vector impedance system (100) operates to calculate a complex impedance using both the magnitude and phase angle of the second network measurement as determined by a processor (133). In that the lower frequency at which signal processing is performed is a fixed frequency, many sensitive parameters of the band pass filters, such as gain and phase shift, can be easily calibrated and do not change during operation, resulting in a simpler calibration process and very accurate data measurements.

REFERENCES:
patent: 4409544 (1983-10-01), Redlich
patent: 6326929 (2001-12-01), Berranger
patent: 6876935 (2005-04-01), Kamitani
patent: 7030627 (2006-04-01), Ashley
patent: 2008/0234574 (2008-09-01), Hancock et al.
Hallas, Joel R., Three Antenna System Measurement Devices, QST, Aug. 2007.
Keith, Larry, TinyCAD, QST, Aug. 2007.

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