4. Television
  5. Special applications
  6. Manufacturing

Robert H. Clunn

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Apparatus and method for pattern location

Image analysis – Histogram processing – For setting a threshold
Patent

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Semiconductor device lead inspection system

Television – Special applications – Manufacturing
Patent

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Vector impedance measurement system and method of using same

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1628913

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