Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate
2006-08-31
2010-06-15
Rizk, Sam (Department: 2112)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital data error correction
C714S755000, C714S769000, C711S103000, C711S113000, C711S118000
Reexamination Certificate
active
07739576
ABSTRACT:
Memory devices, circuitry, and data methods are described that facilitate the detection and correction of data in memory controllers, memory systems, and/or non-volatile memory devices by allowing the number of ECC check bytes being utilized to be varied to increase or decrease the ECC check depth. This allows the depth of the ECC coverage (the overall number of bit errors detectable and/or correctable in each sector by the stored ECC check bytes) to be selected based on the application, the amount of available data storage for ECC check bytes in the overhead/spare area associated with the sector, the version of memory device or controller being utilized, or the number of errors being seen in the memory system, device, bank, erase block, or sector (the error incidence rate), while the base data size of the area (sector) covered by the ECC check bytes stays the same.
REFERENCES:
patent: 5459850 (1995-10-01), Clay et al.
patent: 5754567 (1998-05-01), Norman
patent: 5854800 (1998-12-01), Thomann et al.
patent: 5864569 (1999-01-01), Roohparvar
patent: 5923682 (1999-07-01), Seyyedy
patent: 6076182 (2000-06-01), Jeddeloh
patent: 6141249 (2000-10-01), Estakhri et al.
patent: 6279072 (2001-08-01), Williams et al.
patent: 6741253 (2004-05-01), Radke et al.
patent: 6838331 (2005-01-01), Klein
patent: 7010645 (2006-03-01), Hetzler et al.
patent: 2003/0115538 (2003-06-01), Derner et al.
patent: 2004/0210709 (2004-10-01), Conley et al.
patent: 2005/0172065 (2005-08-01), Keays
patent: 2005/0268203 (2005-12-01), Keays et al.
patent: 2005/0283650 (2005-12-01), Zhang et al.
patent: 2006/0098484 (2006-05-01), Roohparvar
Leffert Jay & Polglaze P.A.
Micro)n Technology, Inc.
Rizk Sam
LandOfFree
Variable strength ECC does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Variable strength ECC, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Variable strength ECC will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4221561