Variable resistive memory punchthrough access method

Static information storage and retrieval – Systems using particular element – Resistive

Reexamination Certificate

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C365S171000, C365S173000, C365S158000

Reexamination Certificate

active

07936583

ABSTRACT:
Variable resistive punchthrough access methods are described. The methods include switching a variable resistive data cell from a high resistance state to a low resistance state by passing a write current through the magnetic tunnel junction data cell in a first direction. The write current is provided by a transistor being electrically coupled to the variable resistive data cell and a source line. The write current passes through the transistor in punchthrough mode.

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