Variable resistance non-volatile memory cells and methods of...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material

Reexamination Certificate

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C438S095000, C438S200000, C438S201000, C438S202000, C438S203000, C438S204000, C438S597000, C438S625000, C438S626000, C438S627000, C438S628000, C438S629000, C257S002000, C257S005000, C257S041000, C257S050000, C257S003000, C257S004000, C257S529000, C257S530000, C257SE21008, C257SE21019

Reexamination Certificate

active

07863173

ABSTRACT:
Methods of fabricating integrated circuit memory cells and integrated circuit memory cells are disclosed. An integrated circuit memory cell can be fabricated by forming a cup-shaped electrode on sidewalls of an opening in an insulation layer and through the opening on an ohmic layer that is stacked on a conductive structure. An insulation filling member is formed that at least partially fills an interior of the electrode. The insulation filling member is formed within a range of temperatures that is sufficiently low to not substantially change resistance of the ohmic layer. A variable resistivity material is formed on the insulation filling member and is electrically connected to the electrode.

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