Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-03-11
2010-10-26
Levin, Naum B (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C703S014000
Reexamination Certificate
active
07823106
ABSTRACT:
A method, computer system and program product introduce adding a variable performance ranking parameter to a diagram of a circuit to drive implementation of modifications that are yield improving, performance boosting, or performance-neutral. The information is paired to accomplish a more complete design for manufacturability modification in the design of circuits implemented on chips. In this matter, both yield and chip performance are improved.
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Baker Faye D.
Beckenbaugh Mark R.
Freerksen Jason J.
Levy Mark D.
International Business Machines - Corporation
Levin Naum B
Toler Law Group
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