Static information storage and retrieval – Read/write circuit – Testing
Patent
1997-11-25
1999-05-11
Hoang, Huan
Static information storage and retrieval
Read/write circuit
Testing
365203, 365205, 365207, 365202, G11C7/00
Patent
active
059035021
ABSTRACT:
A method and circuit for rapidly equilibrating paired digit lines of a memory array of a dynamic random access memory device is described. The equilibrate circuit includes a bias-circuit coupled to sense amplifier circuitry for adjusting the equilibrate voltage during testing. A method is described for testing memory cell margin by adjusting the equilibrate voltage until an error is detected. The bias circuit is described as a pull-up transistor coupled to a common mode of a cross-coupled n-sense amplifier.
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patent: 5369317 (1994-11-01), Casper et al.
patent: 5680344 (1997-10-01), Seyyedy
Hoang Huan
Micro)n Technology, Inc.
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