Variable angle of incidence reflectometer with a continuous read

Details Variable angle of incidence reflectometer with a continuous read Variable angle of incidence reflectometer with a continuous read

1978-08-07

1980-05-06

Corbin, John K.

Optics: measuring and testing

By polarized light examination

Of surface reflection

250224, 356445, G01N 2148

Patent

active

042014743

ABSTRACT:
An instrument (reflectometer) for continuously measuring the reflectance perties of materials as a function of the angle of incidence in which a sample and a mirror are mounted on a rotating platform in such a manner that, as the angle of incidence on the sample is varied, the reflected radiation is always incident on a detector which is fixed with respect to the rotating platform. The angle of incidence on the sample is measured and used to drive an axis of an X-Y recorder. The angle of incidence on the mirror is measured and used to correct the detected signal for any errors introduced by the properties of the mirror. This corrected signal is then used to drive the other axis of the X-Y recorder to produce a plot of the reflection coefficients vs angle of incidence for the sample. For fixed angles of incidence on the sample the detector can be moved to produce a plot of the diffused reflections as a function of the angular deviation from the specular angle. For this purpose the position of the detector is measured and used to drive the x-axis of the X-Y recorder. The input radiation is generally obtained from a laser and the instrument is supplied with polarizers or a polarization rotator as desired.

REFERENCES:
patent: 2406166 (1946-08-01), Scott
patent: 3402631 (1968-09-01), Potter
patent: 3603690 (1971-09-01), Hard

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