Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-09-23
2008-11-18
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C702S065000
Reexamination Certificate
active
07454723
ABSTRACT:
An electrical resistance determination method. Input to the method includes a description of at least one electrical network within a substrate. The description includes specification of a plurality of first ports on a first side of the substrate, and a plurality of second ports on a second side of the substrate, for each electrical network. All of the first ports are electrically isolated from one another. All of the second ports are electrically connected to a common voltage. A computer readable program code, which is executed by a processor of a computer system computes for a first electrical network of the at least one electrical network an electrical resistance between each first port and a port of the second ports. The computer code may also display a perspective plot of the computed electrical resistances as a bar oriented about normal to each first port.
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Budell Timothy W.
Buffet Patrick H.
Lussier Craig P.
Dinh Paul
International Business Machines - Corporation
Schmeiser Olsen & Watts
Yaghmour Rosa S.
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