Using data compression for faster testing of embedded memory

Details Using data compression for faster testing of embedded memory Using data compression for faster testing of embedded memory

2005-09-27

2005-09-27

Decady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Replacement of memory spare location, portion, or segment

C714S723000, C365S185090

Reexamination Certificate

active

06950971

ABSTRACT:
A memory apparatus is configured by obtaining test information for each of group of memory locations within the memory apparatus, compressing the test information to produced compressed test information and, based on the compressed test information, replacing a group of redundant memory circuits respectively associated with the group of memory locations.

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