Using component-level calibration data to reduce...

Details Using component-level calibration data to reduce... Using component-level calibration data to reduce...

2006-11-14

2006-11-14

Nghiem, Michael (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

Reexamination Certificate

active

07136770

ABSTRACT:
Using component-level test data to reduce system test. By modeling a system, sensitivity analysis reveals critical components and parameters of those components required to meet system performance parameters. Critical components are tested for these parameters, and these measurements associated with the components. Systems may be assembled which are modeled to meet the system performance parameters based on the model and the measured parameters. Systems may be assembled and calibration coefficients derived and applied from the model and the measured parameters.

REFERENCES:
patent: 6090151 (2000-07-01), Gehman et al.
patent: 2004/0167765 (2004-08-01), Abu El Ata

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