Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2011-01-25
2011-01-25
Maskulinski, Michael C (Department: 2113)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
Reexamination Certificate
active
07877645
ABSTRACT:
The use of operational configuration parameters to predict digital system failures is described herein. At least some illustrative embodiments include a method that includes initializing a digital system (the initializing comprising determining an operational configuration of at least part of the digital system), saving the operational configuration to a database stored on the digital system, reading the operational configuration from the database and comparing the operational configuration to a reference configuration, and identifying the digital system as being at risk of a future failure if at least one parameter of the operational configuration differs from the at least one same parameter of the reference configuration by more than a tolerance value.
REFERENCES:
patent: 5528516 (1996-06-01), Yemini et al.
patent: 5539592 (1996-07-01), Banks et al.
patent: 7370241 (2008-05-01), Nicholson et al.
patent: 7526684 (2009-04-01), Bicknell et al.
patent: 7539907 (2009-05-01), Johnsen et al.
patent: 2003/0084381 (2003-05-01), Gulick
patent: 2004/0168108 (2004-08-01), Chan et al.
patent: 2005/0216800 (2005-09-01), Bicknell et al.
patent: 2008/0189578 (2008-08-01), Raghuraman et al.
P.G. Daly, XML Basics and Benefits, Dec. 8, 2003, http://www.intranetjournal.com/articles/200312/pij—12—08—03a.html.
Allan, G.; “The Love/Hate Relationship with DDR SDRAM Controllers,” Reprint from SOCentral.com; Jul. 3, 2006; 3 p.; Tech Pro Communications; Merrimack, NH, http://soccentral.com/PrintPage.asp?PassedID=19574.
Mahajan, R.; “Memory Design Considerations When Migrating to DDR3 Interfaces from DDR2”; R&D Headline News; Copyright 2006 Design and Reuse S.A.; 5 p.; http://www.us.design-reuse.com
ews?id=15699&print=yes.
Covington Robert R.
Meyer John E.
Miller Joseph P.
Wade Mark A.
Hewlett--Packard Development Company, L.P.
Maskulinski Michael C
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