Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-10-03
2006-10-03
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C365S185010
Reexamination Certificate
active
07117474
ABSTRACT:
A circuit to detect the use of an element of an integrated circuit may include a non-volatile electrically programmable storage circuit and a programming circuit. The programming circuit may be used to partially program the storage circuit and gradually modify its programming level as the element is used so that the level represents the number of uses of the element.
REFERENCES:
patent: 5668756 (1997-09-01), Tomioka
patent: 5682345 (1997-10-01), Roohparvar et al.
patent: 5968183 (1999-10-01), Pascucci
patent: 5978261 (1999-11-01), Tailliet
patent: 6292394 (2001-09-01), Cohen et al.
patent: 6330185 (2001-12-01), Wong et al.
patent: 6538929 (2003-03-01), Hiraki et al.
patent: 6600676 (2003-07-01), Shibata et al.
patent: 6708319 (2004-03-01), Adachi et al.
Liardet Pierre-Yvan
Mussard Bruno
Allen Dyer Doppelt Milbrath & Gilchrist, P.A.
Chiang Jack
Jorgenson Lisa K.
STMicroelectronics SA
Tat Binh
LandOfFree
Use detecting circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Use detecting circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Use detecting circuit will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3656313