Electricity: measuring and testing – Plural – automatically sequential tests
Patent
1996-10-31
1998-10-20
Karlsen, Ernest F.
Electricity: measuring and testing
Plural, automatically sequential tests
324760, G01R 3102
Patent
active
058251715
ABSTRACT:
A universal burn-in board for burning-in semiconductor devices. The universal burn-in board is easily reconfigurable so that it may be used with a variety of semiconductor devices having the same pin configuration but different functional characteristics. The universal burn-in board comprises: a socket having a plurality of connectors where target semiconductors to be burned-in are inserted; a first unit having a first node connected to one of the plurality of connectors, an isolation resistor connected between the first node and a test signal line, a first power node to which power voltage and ground voltage are input, a first ground node and a first passing node connected to the first node; a second unit having a second power node connected to each of the first power node and the first ground node, a second ground node and a second passing node connected to the test signal line; and a selecting unit for selectively connecting the first power node, first ground node and first passing node of the first unit and the second power node, second ground node and second passing node and providing burn-in test signals according to the characteristics of the target semiconductor device pin connected to the first node.
REFERENCES:
patent: 4777434 (1988-10-01), Miller et al.
patent: 5396185 (1995-03-01), Honma et al.
patent: 5659245 (1997-08-01), Ping et al.
Geary, Jr. William L.
Karlsen Ernest F.
Phung Anh
Samsung Electronics Co,. Ltd.
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