Uniform film thickness deposition of sputtered materials

Chemistry: electrical and wave energy – Apparatus – Coating – forming or etching by sputtering

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C23C 1434

Patent

active

059193450

ABSTRACT:
A sputtering chamber includes a substrate support member, for positioning a substrate thereon, and a sputtering target therein. At least a portion of the sputtering surface of the target is located non-parallel to the substrate. In one aspect of the invention, the sputtering surface of the target is conical, and it tapers as it approaches the substrate.

REFERENCES:
patent: 3654110 (1972-04-01), Kraus
patent: 3988232 (1976-10-01), Wasa et al.
patent: 4394236 (1983-07-01), Robinson
patent: 4414086 (1983-11-01), Lamont, Jr.
patent: 4457825 (1984-07-01), Lamont, Jr.
patent: 4547279 (1985-10-01), Kiyota et al.
patent: 4622121 (1986-11-01), Wegmann et al.
patent: 4673480 (1987-06-01), Lamont, Jr.
patent: 4721553 (1988-01-01), Saito et al.
patent: 4747926 (1988-05-01), Shimizu et al.
patent: 4756810 (1988-07-01), Lamont, Jr. et al.
patent: 4957605 (1990-09-01), Hurwitt et al.
patent: 5194131 (1993-03-01), Anderson
patent: 5252194 (1993-10-01), Demaray et al.
patent: 5320728 (1994-06-01), Tepman
patent: 5490913 (1996-02-01), Schertler et al.
patent: 5556525 (1996-09-01), Krivokapic et al.

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